SYSTEMS AND METHODS FOR FACILITATING AUTOMATED TEST EQUIPMENT FUNCTIONALITY WITHIN INTEGRATED CIRCUITS

摘要

A preferred system for facilitating automated test equipment functionality withinintegrated circuits includes automated test equipment (218, 502) configured toelectrically interconnect with an integrated circuit (210, 510) and to provide at least onesignal to the integrated circuit. A first parametric test circuit (220, 530, 540, 550, 560,570, 580), internal to the integrated circuit, also is provided. The first parametric testcircuit is adapted to electrically communicate with the automated test equipment so that,in response to receiving a signal from the automated test equipment, the first parametrictest circuit measures at least one parameter of a first pad (216, 512, 514, 516, 518, 520,522) of the integrated circuit. Integrated circuits, methods and computer readable mediaalso are provided.