首页> 外国专利> METHOD FOR PRODUCING A SUBLITHOGRAPHIC GATE STRUCTURE FOR FIELD EFFECT TRANSISTORS, AND FOR PRODUCING AN ASSOCIATED FIELD EFFECT TRANSISTOR, AN ASSOCIATED INVERTER, AND AN ASSOCIATED INVERTER STRUCTURE

METHOD FOR PRODUCING A SUBLITHOGRAPHIC GATE STRUCTURE FOR FIELD EFFECT TRANSISTORS, AND FOR PRODUCING AN ASSOCIATED FIELD EFFECT TRANSISTOR, AN ASSOCIATED INVERTER, AND AN ASSOCIATED INVERTER STRUCTURE

机译:用于产生场效应晶体管的超光刻门控结构的方法,以及用于产生相关的场效应晶体管,相关的逆变器和相关的逆变器结构的方法

摘要

The invention relates to a method for producing: a sublithographic gate structure; an associated field effect transistor; an associated inverter, and; an associated inverter structure. A sublithographic gate structure (SG) having slight variations in the critical dimensions thereof can be directly produced on the lateral walls of a lithographically structured mask (M0, 2) by the conformal formation of a gate insulation layer (3) and of a gate layer with subsequently executed anisotropic etching.
机译:本发明涉及一种制造方法:亚光刻栅极结构;相关的场效应晶体管;相关的逆变器;以及相关的逆变器结构。可以通过共形地形成栅极绝缘层(3)和栅极层,在光刻结构化的掩模(M0、2)的侧壁上直接生产其临界尺寸略有变化的亚光刻栅极结构(SG)。随后执行各向异性蚀刻。

著录项

  • 公开/公告号WO2004057660A3

    专利类型

  • 公开/公告日2005-03-31

    原文格式PDF

  • 申请/专利号WO2003DE04046

  • 发明设计人 TEWS HELMUT;FEHLHABER RODGER;

    申请日2003-12-09

  • 分类号H01L21/336;H01L21/8238;H01L27/092;H01L29/423;H01L29/78;H01L21/28;H01L21/768;H01L21/8234;

  • 国家 WO

  • 入库时间 2022-08-21 22:12:44

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