IN-SITU CONTROL SYSTEM, CHARACTERISATION DEVICE AND METHOD FOR CONTROL OF AN ANGLE OF ATTACK PROBE

摘要

The invention relates to an in-situ control system, a characterisation device and a method for control of a moving angle of attack probe, for example, mounted on the skin of an aircraft. The probe comprises a moving vane (15), rotating about an axis (Δs) with relation to a probe body (11). The in-situ control device and the characterisation device comprise an enveloping structure (26), for housing the vane (15). The enveloping structure (26) forms the same mechanical reference for the two devices in the determination of the angle of rotation about the axis (Δs). The method uses the in-situ control device to control the probe as a function of the characterisation angle thereof.