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METHOD TO EVALUATE AND IMPROVE THE TESTABILITY OF ELECTRONIC PRODUCTS

机译:评估和改善电子产品可测试性的方法

摘要

A method for Design For Testing (DFT), which presents testability and a methodology to provide the testability. This method defines the testability presentation format of electronic products in a simple form (202). One number or few numbers is used from the initial stage of the electronic product design for integrated circuits (IC's), systems on chip (SOC's), electronic boards, and electronic systems, to the final stage of the design wherein volume production is begun. The testability number becomes more accurate as more information (203) is provided as progress is made through the design stages (201). The methodology is a complete technique to provide the testability numbers.
机译:一种用于测试设计(DFT)的方法,该方法介绍了可测试性和提供可测试性的方法。该方法以简单形式定义了电子产品的可测试性表示格式(202)。从集成电路(IC),片上系统(SOC),电子板和电子系统的电子产品设计的初始阶段到开始批量生产的设计的最后阶段,使用一个或几个数字。随着设计阶段(201)的进展,随着提供更多信息(203),可测试性数字变得更加准确。该方法是提供可测试性数字的完整技术。

著录项

  • 公开/公告号WO2004114050A2

    专利类型

  • 公开/公告日2004-12-29

    原文格式PDF

  • 申请/专利权人 LIVNE SHMUEL;

    申请/专利号WO2004IL00560

  • 发明设计人 LIVNE SHMUEL;

    申请日2004-06-23

  • 分类号G06F;

  • 国家 WO

  • 入库时间 2022-08-21 22:12:10

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