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METHOD TO EVALUATE AND IMPROVE THE TESTABILITY OF ELECTRONIC PRODUCTS
METHOD TO EVALUATE AND IMPROVE THE TESTABILITY OF ELECTRONIC PRODUCTS
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机译:评估和改善电子产品可测试性的方法
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摘要
A method for Design For Testing (DFT), which presents testability and a methodology to provide the testability. This method defines the testability presentation format of electronic products in a simple form (202). One number or few numbers is used from the initial stage of the electronic product design for integrated circuits (IC's), systems on chip (SOC's), electronic boards, and electronic systems, to the final stage of the design wherein volume production is begun. The testability number becomes more accurate as more information (203) is provided as progress is made through the design stages (201). The methodology is a complete technique to provide the testability numbers.
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