THREE-DIMENSIONAL SHAPE MEASURING DEVICE, IMAGING DEVICE, AND THREE-DIMENSIONAL SHAPE MEASURING PROGRAM

摘要

Three-dimensional shape measuring means comprises light-projecting means for projecting a pattern light, imaging means for capturing a pattern light projection image of an object onto which the pattern light is projected, pattern light position extracting means for extracting the position of the pattern light referring to the pattern light projection image, three-dimensional shape calculating means for calculating the three-dimensional shape of the object according to the position the pattern light, storage means storing color value data on the pattern light projection image, hue parameter calculating means for calculating a hue parameter, for each pixel, corresponding to main hues constituting the pattern light from the color value data, luminance parameter calculating means for calculating a luminance parameter, for each pixel, from the color value data, and pattern light detecting means for detecting pixels including the pattern light from the pattern light projection image by using the luminance parameter and the hue parameter. The pattern light position extracting means extracts the position of the pattern light referring to the pixels including the pattern light.