SEMICONDUCTOR DEVICE CAPABLE OF MEASURING SELF VIA AND VIA MEASURING APPARATUS AND METHOD THEREFORE TO SHORTEN INTERVAL OF TEST TIME

摘要

PURPOSE: A semiconductor device capable of measuring a self via is provided to be advantageous to a signal transfer by directly connecting the output terminal of an internal voltage generating unit to a via pattern, and to shorten an interval of test time by determining whether a normal via pattern or an abnormal via pattern exists. CONSTITUTION: At least one test mode pad(110) is exposed to the outside through a protection layer. A mode set register(120) has an n-bit, connected to the test mode pad. The internal voltage generating unit decreases the voltage of applied Vdd(132) to output a voltage of several tens of milli volts, connected to the mode set register. At least one via pattern(140) forms a current path made by the voltage of several tens of milli volts, installed between the internal voltage generating unit and the test mode pad.