首页> 外国专利> MRAM AND DATA READ METHOD THEREOF, ESPECIALLY SETTING ELECTRIC POTENTIAL OF UNSELECTED NEGATIVE BIT LINES EQUAL TO MAIN BIT LINE

MRAM AND DATA READ METHOD THEREOF, ESPECIALLY SETTING ELECTRIC POTENTIAL OF UNSELECTED NEGATIVE BIT LINES EQUAL TO MAIN BIT LINE

机译:MRAM及其数据读取方法,特别是将未选择的负位线的电势设置成等于主位线的电势

摘要

PURPOSE: A MRAM(Magnetic Random Access Memory) and a data read method thereof are provided to achieve a high speed access to achieve large capacity and large integration by using cross-point memory cells. CONSTITUTION: Cross point type memory cells(MC11 - MC48) formed with MTJ devices are arranged in a plurality of memory cell blocks. Memory cells in the first memory cell block are connected to negative bit lines(SBL1,SBL3,SBL5,SBL7) respectively. Memory cells in the second memory cell block are connected to negative bit lines(SBL2,SBL4,SBL6,SBL8) respectively. The negative bit lines are connected to main bit lines(MBL1 - MBL4) through current path of selection MOS transistors(Q1 - Q8).
机译:目的:提供一种MRAM(磁性随机存取存储器)及其数据读取方法,以通过使用交叉点存储单元来实现高速访问以实现大容量和大集成度。构成:由MTJ器件形成的交叉点型存储单元(MC11-MC48)被安排在多个存储单元块中。第一存储单元块中的存储单元分别连接到负位线(SBL1,SBL3,SBL5,SBL7)。第二存储单元块中的存储单元分别连接到负位线(SBL2,SBL4,SBL6,SBL8)。负位线通过选择MOS晶体管(Q1-Q8)的电流路径连接到主位线(MBL1-MBL4)。

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