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MRAM AND DATA READ METHOD THEREOF, ESPECIALLY SETTING ELECTRIC POTENTIAL OF UNSELECTED NEGATIVE BIT LINES EQUAL TO MAIN BIT LINE
MRAM AND DATA READ METHOD THEREOF, ESPECIALLY SETTING ELECTRIC POTENTIAL OF UNSELECTED NEGATIVE BIT LINES EQUAL TO MAIN BIT LINE
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机译:MRAM及其数据读取方法,特别是将未选择的负位线的电势设置成等于主位线的电势
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摘要
PURPOSE: A MRAM(Magnetic Random Access Memory) and a data read method thereof are provided to achieve a high speed access to achieve large capacity and large integration by using cross-point memory cells. CONSTITUTION: Cross point type memory cells(MC11 - MC48) formed with MTJ devices are arranged in a plurality of memory cell blocks. Memory cells in the first memory cell block are connected to negative bit lines(SBL1,SBL3,SBL5,SBL7) respectively. Memory cells in the second memory cell block are connected to negative bit lines(SBL2,SBL4,SBL6,SBL8) respectively. The negative bit lines are connected to main bit lines(MBL1 - MBL4) through current path of selection MOS transistors(Q1 - Q8).
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