首页> 外国专利> GaN SEMICONDUCTOR LIGHT EMITTING DEVICE HAVING BUFFER LAYER WITH ENHANCED STRUCTURE AND ACTIVE LAYER WITH QUANTUM WELL STRUCTURE FOR REDUCING CRYSTAL DEFECTS AND ACQUIRING HIGH BRIGHTNESS AND MANUFACTURING METHOD THEREOF

GaN SEMICONDUCTOR LIGHT EMITTING DEVICE HAVING BUFFER LAYER WITH ENHANCED STRUCTURE AND ACTIVE LAYER WITH QUANTUM WELL STRUCTURE FOR REDUCING CRYSTAL DEFECTS AND ACQUIRING HIGH BRIGHTNESS AND MANUFACTURING METHOD THEREOF

机译:具有增强结构的缓冲层和具有量子阱结构的有源层的GaN半导体发光器件,用于减少晶体缺陷并获得高亮度,并且其制造方法

摘要

PURPOSE: A GaN semiconductor light emitting device and a manufacturing method thereof are provided to reduce crystal defects and to acquire high brightness by using a buffer layer with an enhanced structure and an active layer with a quantum well structure. CONSTITUTION: A GaN semiconductor light emitting device includes a substrate(102), a GaN based buffer layer(104) on the substrate, a first In-doped GaN layer(106) on the buffer layer, an N type first electrode layer(108) on the first In-doped GaN layer, an active layer(116) for emitting light on the first electrode layer, a p-GaN layer(118) on the active layer and an InxGa1-xN/InyGa1-yN super lattice structure layer(120) on the p-GaN layer. The GaN based buffer layer is composed of one selected from a group consisting of an InGaN/GaN super lattice structure and a stacked structure of InxGa1-xN/GaN and AlxInyGa1-x,yN/InxGa1-xN/GaN. The active layer is composed of a single quantum well structure or a multi-quantum well structure.
机译:目的:提供一种GaN半导体发光器件及其制造方法,以通过使用具有增强的结构的缓冲层和具有量子阱结构的有源层来减少晶体缺陷并获得高亮度。组成:一种GaN半导体发光器件,包括衬底(102),衬底上的GaN基缓冲层(104),缓冲层上的第一In掺杂GaN层(106),N型第一电极层(108) )在第一In掺杂GaN层上,用于在第一电极层上发光的有源层(116),在有源层上的p-GaN层(118)和InxGa1-xN / InyGa1-yN超晶格结构层(120)在p-GaN层上。 GaN基缓冲层由选自InGaN / GaN超晶格结构以及InxGa1-xN / GaN和AlxInyGa1-x,yN / InxGa1-xN / GaN的堆叠结构中的一种构成。有源层由单量子阱结构或多量子阱结构组成。

著录项

  • 公开/公告号KR20050000846A

    专利类型

  • 公开/公告日2005-01-06

    原文格式PDF

  • 申请/专利权人 LG INNOTEC CO. LTD.;

    申请/专利号KR20030041409

  • 发明设计人 LEE SUK HUN;

    申请日2003-06-25

  • 分类号H01L33/00;

  • 国家 KR

  • 入库时间 2022-08-21 22:06:06

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号