首页> 外国专利> METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE WITH TRENCH TYPE ISOLATION LAYER CAPABLE OF REMOVING RESIDUAL LAYER OF GATE MATERIAL IN MOAT BY FILLING MOAT USING INSULATING LAYER

METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE WITH TRENCH TYPE ISOLATION LAYER CAPABLE OF REMOVING RESIDUAL LAYER OF GATE MATERIAL IN MOAT BY FILLING MOAT USING INSULATING LAYER

机译:制造具有沟槽型隔离层的半导体器件的方法,该绝缘层能够通过利用绝缘层填充护沟来去除护城河中的栅状材料的残留层

摘要

Purpose: a kind of method is used to remove the residual layer of the grid material in moat for manufacturing the semiconductor device with a trench type separation layer by being arranged to prevent bridge between gate electrode filling an insulating layer in moat. Construction: a bar ditch (22) are formed in semi-conductive substrate (21). One separation layer (23) is formed by filling a first insulating layer in ditch, and wherein moat results from the top corner of ditch. Second insulating layer is formed in composite structure. By the blanket etch of second insulating layer according to the surface of substrate using an etching target, an insulating layer (25a) is filled in moat. Then, a gate insulating layer (26) and a polysilicon layer (27) are sequentially formed on substrate. By etching polysilicon layer, a gate electrode is formed.
机译:目的:一种方法是通过布置成防止栅电极填充沟between中的绝缘层之间的桥接来去除沟at中的网格材料的残留层,以制造具有沟槽型分离层的半导体器件。构造:在半导体衬底(21)中形成条沟(22)。一个隔离层(23)是通过在沟渠中填充第一绝缘层而形成的,其中沟渠的顶部是沟纹。第二绝缘层以复合结构形成。通过使用蚀刻目标根据基板的表面对第二绝缘层进行毯式蚀刻,在沟中填充绝缘层(25a)。然后,在基板上依次形成栅极绝缘层(26)和多晶硅层(27)。通过蚀刻多晶硅层,形成栅电极。

著录项

  • 公开/公告号KR20050002047A

    专利类型

  • 公开/公告日2005-01-07

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR20030043093

  • 发明设计人 CHOI IK SOO;

    申请日2003-06-30

  • 分类号H01L21/76;

  • 国家 KR

  • 入库时间 2022-08-21 22:06:03

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