METHOD FOR CONTROLLING THE DELAY TIME IN SEMICONDUCTOR MEMORY DEVICE, ESPECIALLY CONTROLLING THE AMOUNT OF DELAY ARBITRARILY

摘要

PURPOSE: A method for controlling the delay time in a semiconductor memory device regardless of delay circuit is provided to control the delay time by controlling a falling point of a pulse signal for a test mode. CONSTITUTION: A method for controlling the delay time in a semiconductor memory device comprises the steps of: applying a test mode pulse signal(a); generating N test mode select signals (N is a numeral) which are synchronizing and responding to every falling edge of the test mode pulse signal according to the order(b); regenerating (N-1)th test mode select signal in order after generating Nth test mode select signal(c); repeating the (d) and (c) steps. Wherein, the input signal is delayed when the first to (N-1)th test mode select signals are enabled. And the delay time is controlled by controlling the pulse width of the Nth and (N-1)th test mode select signal through controlling the falling point of the test mode pulse signal.