首页> 外国专利> ANALYSIS METHOD AND APPARATUS FOR POOR LCD MODULE BY USE OF CAMERA MULTIPLE FOCUS PROCESS

ANALYSIS METHOD AND APPARATUS FOR POOR LCD MODULE BY USE OF CAMERA MULTIPLE FOCUS PROCESS

机译:基于相机多焦点过程的液晶模组不良分析方法及装置

摘要

The invention disclosed is to be able to take pictures using the camera at each floor of the LCD module, as by using a video signal recording layer by layer on a multi-focus type LCD module failure analysis method for and an apparatus for analyzing a failure state, the camera one operates the focus of a previously set-up procedure for a non-defective LCD module and, based on data generated by generating and storing a plurality of reference data using a recording signal; By operating a focus of a camera in a predetermined sequence taking the LCD module for inspection, and then, by using the recording signal comparison data generating process of generating a plurality of comparison data; And the comparison data and the reference data is characterized by being a defect analysis process to be compared to each floor, and floor outputs each state on the display to an inspector analyze the floor bad.
机译:所公开的本发明能够使用在多焦点型LCD模块的故障分析方法和用于分析故障的设备上逐层使用视频信号记录,从而在LCD模块的每一层使用照相机来拍照。在这种状态下,照相机对用于无缺陷的LCD模块的先前设置过程的焦点进行操作,并且基于通过使用记录信号生成和存储多个参考数据而生成的数据;通过以预定顺序操作照相机的焦点,以将LCD模块进行检查,然后,通过使用记录信号比较数据生成过程来生成多个比较数据;并且,比较数据和参考数据的特征在于是要与每个地板进行比较的缺陷分析处理,并且地板将显示器上的每个状态输出到检查人员以分析地板不良。

著录项

  • 公开/公告号KR20050068085A

    专利类型

  • 公开/公告日2005-07-05

    原文格式PDF

  • 申请/专利权人 IDS CO. LTD.;

    申请/专利号KR20030099139

  • 发明设计人 CHANG YOON SEOK;KIM KYUNG SIK;

    申请日2003-12-29

  • 分类号G02F1/13;

  • 国家 KR

  • 入库时间 2022-08-21 22:05:01

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