首页> 外国专利> TEMPERATURE CONTROL DEVICE OF LAMP HOUSE IN WWE PROCESS AND METHOD THEREIN

TEMPERATURE CONTROL DEVICE OF LAMP HOUSE IN WWE PROCESS AND METHOD THEREIN

机译:WWE过程中灯箱的温度控制装置及其方法

摘要

The present invention wafer edge exposure lamp to house a temperature controlled to an apparatus and temperature control method, at the wafer edge exposure process for exposing the edge portion of the photolithography process of the wafer to form a pattern on the wafer is irradiated to a wafer in the lamp housing for generating light, wherein the lamp house is to improve the conventional cooling means to prevent overheating by the light generated inside, the branch lines for supplying the clean dry air in the semiconductor production equipment lamp by providing the inner house, the effective features to prevent overheating of the lamp housing without the need for a separate box for installation of the equipment.
机译:本发明的晶片边缘曝光灯用于容纳温度受控的设备和温度控制方法,在用于曝光晶片的光刻工艺的边缘部分以在晶片上形成图案的晶片边缘曝光工艺中,照射晶片。在用于产生光的灯壳体中,其中,灯壳体用于改进传统的冷却装置,以防止内部产生的光使之过热;通过提供内壳体,用于在半导体生产设备灯中供应清洁干燥空气的支线,防止灯罩过热的有效功能,而无需使用单独的设备安装盒。

著录项

  • 公开/公告号KR20050069685A

    专利类型

  • 公开/公告日2005-07-05

    原文格式PDF

  • 申请/专利权人 DONGBUANAM SEMICONDUCTOR INC.;

    申请/专利号KR20030102001

  • 发明设计人 UHM KYOUNG SAM;

    申请日2003-12-31

  • 分类号H01L21/027;

  • 国家 KR

  • 入库时间 2022-08-21 22:04:59

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