首页> 外国专利> WAFER FORM LOT IDENTIFICATION AND SEMICONDUCTOR PRODUCTION DEVICE FOR RECOGNIZING LOT IDENTIFICATION OF WAFER THEREOF

WAFER FORM LOT IDENTIFICATION AND SEMICONDUCTOR PRODUCTION DEVICE FOR RECOGNIZING LOT IDENTIFICATION OF WAFER THEREOF

机译:晶圆形式批号识别和半导体生产设备,用于识别晶圆的批号

摘要

The present invention relates to a semiconductor manufacturing apparatus for forming a bar code on the flat zone of the wafer is recognized that the bar code is formed.; A semiconductor manufacturing apparatus for identifying the lot information of the wafer of the invention for this purpose is provided with a plurality of cassettes which the wafer is housed a bar code formed on the flat zone region, and the cassette when it rests formed on the wafer to carry out the process and which receives the bar code the bar code reader for reading the bar code, the read bar code from the bar code reader control to display the lot information, and calculates the process history of the wafer controller, a display unit for displaying the read lot information from the controller It includes.
机译:本发明涉及一种半导体制造设备,用于在识别出条形码的晶片的平坦区域上形成条形码。为此目的,用于识别本发明晶片的批号信息的半导体制造设备设置有多个盒体,其中晶片容纳有形成在平坦区域上的条形码,并且当盒体静止时形成在晶片上。进行处理并接收条形码的条形码读取器读取条形码,从条形码读取器控件读取条形码以显示批次信息,并计算晶片控制器的处理历史,显示单元用于显示从控制器读取的批次信息。

著录项

  • 公开/公告号KR20050104918A

    专利类型

  • 公开/公告日2005-11-03

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20040030371

  • 发明设计人 KANG YUN HEY;

    申请日2004-04-30

  • 分类号H01L21/68;

  • 国家 KR

  • 入库时间 2022-08-21 22:04:21

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