首页> 外国专利> ETCHING SOLUTION TO IMPROVE ETCH RATE FOR COPPER MOLYBDENUM MULTILAYERS AND ETCHING METHOD USING THE SAME

ETCHING SOLUTION TO IMPROVE ETCH RATE FOR COPPER MOLYBDENUM MULTILAYERS AND ETCHING METHOD USING THE SAME

机译:提高铜钼多层薄膜的刻蚀速率的刻蚀解决方案和使用该方法的刻蚀方法

摘要

PURPOSE: Provided are an etching solution for improving etch rate of a copper molybdenum membrane, which controls etch rate easily, is excellent in taper profile and linearity of patterns, and shows a small loss of critical dimension(CD), and an etching method thereof. CONSTITUTION: The etching solution contains 5-15wt%(based on the total weight of the whole composition) of hydrogen peroxide, 1-5wt% of an organic acid, 0.5-5wt% of a sulfuric acid salt, 0.2-5wt% of a cyclic amine compound, and the balance(based on the total weight of the whole composition being 100wt%) being deionized water. And the etching method contains the steps of: depositing the copper molybdenum membrane on a substrate(10); leaving a photoresist(16) selectively on the copper molybdenum membrane; etching the copper molybdenum membrane with the etching solution. The copper molybdenum membrane is a double membrane forming a copper membrane(14) on a molybdenum membrane(12).
机译:用途:提供一种用于提高铜钼膜的蚀刻速率的蚀刻溶液及其蚀刻方法,该蚀刻溶液易于控制蚀刻速率,具有优异的锥度轮廓和图案线性,并且显示出很小的临界尺寸(CD)损失。 。组成:蚀刻溶液包含5-15wt%(基于整个组合物的总重量),过氧化氢,1-5wt%的有机酸,0.5-5wt%的硫酸盐,0.2-5wt%的硫酸盐。环胺化合物,其余部分(以整个组合物的总重量为100wt%)为去离子水。并且该蚀刻方法包括以下步骤:将铜钼膜沉积在基板(10)上;以及将铜钼膜沉积在基板上。在铜钼膜上选择性地留下光致抗蚀剂(16);用腐蚀液腐蚀铜钼膜。铜钼膜是在钼膜(12)上形成铜膜(14)的双层膜。

著录项

  • 公开/公告号KR100480797B1

    专利类型

  • 公开/公告日2005-04-07

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20020044127

  • 发明设计人 김기섭;김성수;오금철;

    申请日2002-07-26

  • 分类号C09K3/14;

  • 国家 KR

  • 入库时间 2022-08-21 22:04:01

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