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Methods for forecasting structure loss rate of silicon crystal ingot, for manufacturing silicon crystal ingot growing funace, and for growing silicon crystal ingot at the furnace

机译:预测硅锭结构损失率,制造硅锭生长物以及在炉子中生长硅锭的方法

摘要

The invention of argon (Ar) gas is injected therein to the growth of, more particularly, silicon single crystal ingot relates to a method of manufacturing method of a structure loss prediction method of the silicon single crystal ingot, the silicon single crystal ingot is grown and the silicon single crystal ingot by him by identifying the relationship between the maximum flow rate and structure loss rate of the silicon single crystal ingot it relates to Consequently method for increasing the yield of the silicon single crystal ingot on the basis thereof.; Technical features of the present invention to achieve this structure, the loss rate of the silicon single crystal ingot which is proportional to the maximum flow rate by calculating the maximum flow rate of the argon gas flowing in the interior of a silicon single crystal ingot grown by a computer simulation (structure loss rate: S / L rate ) can predict what
机译:向其中注入氩气的发明以促进单晶硅锭的生长,更具体地,涉及一种单晶硅锭的结构损失预测方法的制造方法的方法,该单晶硅锭生长通过识别单晶硅锭的最大流量与结构损耗率之间的关系,从而提出了一种在其基础上提高单晶硅锭产量的方法。为了实现这种结构,本发明的技术特征是,通过计算在硅单晶锭内部生长的氩气的最大流量,通过计算通过该单晶硅锭的内部流动的氩气的最大流量,使硅单晶锭的损耗率与最大流量成比例。计算机模拟(结构损耗率:S / L率)可以预测

著录项

  • 公开/公告号KR100488902B1

    专利类型

  • 公开/公告日2005-05-11

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20020071647

  • 发明设计人 이홍우;오현정;

    申请日2002-11-18

  • 分类号C30B31/16;

  • 国家 KR

  • 入库时间 2022-08-21 22:03:50

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