A method for testing an embedded analog core in an integrated circuit chip having a microprocessor core and the memory core is started. This method uses the steps of: providing a test register to the integrated circuit chip between the microprocessor core and the analog core to be tested, the method for testing the microprocessor core and the memory core, the assembly test program running on a microprocessor core, the microprocessor core the step of generating a test pattern by the step of the test pattern by the microprocessor core is applied to the analog core, and a microprocessor core, or an integrated circuit evaluating the response of the analog core by one of the test system provided outside the chip, It includes.
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