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Programming method of reducing set time of Phase-Change memory and writing driver circuit thereof

机译:减少相变存储器置位时间的编程方法及其写驱动器电路

摘要

The programming method and a write driver circuit for implementing a programming method which minimizes the set (set) time for the phase change memory is disclosed. In the programming (programming) method for a phase change memory device comprising a phase change material programming method according to an embodiment of the present invention, which is high in response to the applied current pulses will change state as a resistance or a low resistance, wherein the phase change a current pulse and a second stage having a large current larger than the current size of the first stage (stage) of the first stage having a predetermined amount of current to make the state of the material to a low resistance state in the phase change material and a step of applying. The current size of the first stage is a current, the amount by which heat the phase change material to a nucleation temperature for the greatest chance of the state of the phase change material is in the low resistance state. The current size of the second stage is a current, the amount by which heat the phase change material to the greatest probability of crystal growth temperature to be in a state where the low-resistance state of the phase change material. The second stage is the first stage comes to the next. Programming method and a write driver circuit according to the invention has the advantage of being able to speed up the crystallization operation by allowing the phase change material during the crystallization behavior of the phase change material undergoing the nucleation step through the crystal growth step.
机译:公开了一种编程方法和用于实现使相变存储器的设置(设置)时间最小化的编程方法的写驱动器电路。在根据本发明实施例的包括相变材料编程方法的用于相变存储器件的编程(编程)方法中,该相变存储器件响应于所施加的电流脉冲而变高,将由于电阻或低电阻而改变状态,其中,相变电流脉冲和第二级,该第二级具有比具有预定量的电流的第一级的第一级(级)的电流尺寸大的大电流,以使材料的状态变为低电阻状态。相变材料和应用步骤。第一级的电流大小是电流,以最大的机会使相变材料处于状态的温度将相变材料加热至成核温度的量处于低电阻状态。第二阶段的电流大小是电流,该电流将相变材料加热到晶体生长温度的最大可能性的量处于相变材料的低电阻状态。第二阶段是第一阶段。根据本发明的编程方法和写驱动器电路的优点在于,能够通过使相变材料在经历成核步骤至晶体生长步骤的相变材料的结晶行为期间允许相变材料来加快结晶操作。

著录项

  • 公开/公告号KR100505701B1

    专利类型

  • 公开/公告日2005-08-03

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20030056011

  • 发明设计人 이지혜;조백형;하용호;

    申请日2003-08-13

  • 分类号G11C13/02;

  • 国家 KR

  • 入库时间 2022-08-21 22:03:36

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