首页> 外国专利> METHOD OF MEASURING OF DIELECTRIC CHARACTERISTICS OF POLYCRYSTAL LINE MATERIALS, FOR EXAMPLE, FERRITES

METHOD OF MEASURING OF DIELECTRIC CHARACTERISTICS OF POLYCRYSTAL LINE MATERIALS, FOR EXAMPLE, FERRITES

机译:多晶线材料介电特性的测量方法,例如铁素体

摘要

FIELD: testing equipment.;SUBSTANCE: method of measuring of dielectric characteristics of polycrystalline materials concludes in measurement of values of real and imaginary parts (ε’ and ε’’ correspondingly) of permittivity and dielectric loss tangent tgδ of material. According to the method the guard electrode is applied onto surface around one of measuring electrodes, which guard electrode is grounded when making electric measurements. Current-conducting paste is applied on the top of thin-filmed measuring electrodes. While subjecting sample to heating, capacitance and conductivity values are measured at three to five specific frequencies of measuring signal. Specific parameters of material are determined from the results of measurement for any frequency of measuring signal and average values of the parameters are determined for the whole number of frequencies. Values of ε’ , ε’’ and tgδ are determined for arbitrary values of temperature and frequency of measuring signal.;EFFECT: improved precision of measurement of dielectric characteristics.;1 tbl, 3 dwg
机译:领域:测试多晶材料的介电特性的方法得出的结论是测量介电常数和介电损耗正切tgδ的实部和虚部(分别为“ε”和“ε”)的值。材料。根据该方法,保护电极被施加到测量电极之一周围的表面上,该保护电极在进行电测量时被接地。将导电胶涂在薄膜测量电极的顶部。在加热样品的同时,以三至五个特定频率的测量信号来测量电容和电导率值。对于任何频率的测量信号,根据测量结果确定材料的特定参数,并针对所有频率确定参数的平均值。 &epsi ;、,ε和tgδ的值确定用于温度和频率的任意值的测量信号;效果:提高介电特性的测量精度; 1 tbl,3 dwg

著录项

  • 公开/公告号RU2255344C1

    专利类型

  • 公开/公告日2005-06-27

    原文格式PDF

  • 申请/专利权人

    申请/专利号RU20040114007

  • 申请日2004-05-06

  • 分类号G01R27/26;G01N27/02;

  • 国家 RU

  • 入库时间 2022-08-21 22:02:01

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号