A New Method for Measuring Dielectric Properties of Material Media Using Microstrip Cavity

摘要

A new non-destructive method is developed for measuring the dielectric properties of slab-type materials. The method uses a simple and rapid substitution procedure yielding accurate results. One begins by measuring the resonance frequency and the Q factor of a microstrip cavity with the reference material placed on top of the cavity. The reference material may be conveniently taken to be the same as the substrate. Then, the reference material is replaced by the unknown dielectric material, and the measurements for the resonance frequency and the Q factor are repeated. The two sets of data are then processed to derive the dielectric properties of the unknown material. Several examples of the measured data by this method are also included and it is confirmed that the present method is quite reliable and yet simple in operation. (Author)