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Method and device for the simultaneous determination of at least two material properties of a sample surface, including the adhesion, the friction, the surface topography and the elasticity and rigidity

机译:同时测定样品表面的至少两种材料特性的方法和装置,包括粘合性,摩擦力,表面形貌以及弹性和刚度

摘要

A process for the location-resolved simultaneous detection of the adhesion and friction as well as possibly of other material properties of a sample surface to be examined by means of a raster probe microscope comprising a raster probe. The raster probe and/or the sample with sample surface are moved until at a point of the sample surface to be examined the raster probe interacts in a determined manner with this surface. The raster probe and/or the sample are subjected to a vertical oscillation, and a first measuring signal characterized by the deformation of the raster probe is recorded. A second measuring signal characterizing the deformation of the raster probe is recorded, wherein the raster probe and/or the sample are subjected to a horizontal and/or vertical oscillation. From these two measuring signals the desired material properties are determined. For the detection of the entire surface area to be examined the raster probe and or the sample are again moved and for the repetition of the measuring process described brought into contact with the sample surface in the above described manner.
机译:一种通过位置分辨的同时检测待检测样品表面的粘附和摩擦以及可能的其他材料特性的方法,该方法借助于包括光栅探针的光栅探针显微镜进行。移动光栅探头和/或带有样品表面的样品,直到在要检查的样品表面的一点上,光栅探头以确定的方式与该表面相互作用。光栅探头和/或样品经受垂直振荡,并且记录以光栅探头的变形为特征的第一测量信号。记录表征光栅探针的变形的第二测量信号,其中光栅探针和/或样品经受水平和/或垂直振荡。根据这两个测量信号确定所需的材料性能。为了检测待检查的整个表面区域,再次移动光栅探针和/或样品,并且为了重复进行上述的测量过程,使测量过程以上述方式与样品表面接触。

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