Testing and control process for electronic chips such as logic or memory chips individually compares test data with identifying unit and operates command block or deactivates failures

摘要

A testing and control process for electronic chips comprises comparing command block (101) test data currents with identification units (106a-n), activating the circuits (105a-n) where the data corresponds, rough working at least one command block (102a-k) in the circuit and deactivating circuits having non-corresponding data. An independent claim is also included for a test circuit for the above process.