Semiconductor component test method in which a series of tests are applied to the components with the results of one test used to modify or even cancel the next test

摘要

Semiconductor component test system has a computer arrangement (1) or test unit to test semiconductor components using a series of sequential tests. The results from a first test are evaluated and used to determine the format of the next test, or indeed if the test should be avoided entirely. Subsequent tests are implemented in a similar manner. The invention also relates to a corresponding semiconductor test method.