首页> 外国专利> Production of trench capacitor, used for semiconductor memory cell, comprises providing trench in substrate using hard mask with corresponding mask openings, providing capacitor dielectric in trench, and further processing

Production of trench capacitor, used for semiconductor memory cell, comprises providing trench in substrate using hard mask with corresponding mask openings, providing capacitor dielectric in trench, and further processing

机译:用于半导体存储单元的沟槽电容器的生产包括使用具有相应掩模开口的硬掩模在衬底中提供沟槽,在沟槽中提供电容器电介质以及进一步处理

摘要

Production of a trench capacitor comprises providing a trench (5) in the substrate (1) using a hard mask (2, 3) with corresponding mask openings, providing a capacitor dielectric (30) in the trench and insulating collar (10) in the trench, providing an electrically conducting filler (20) in the trench to protrude over the upper side of the hard mask in the form of a plug, isotropically back-etching the part of the filler protruding over the upper side of the hard mask to a pre-determined thickness, forming a mask over the protruding part of the filler, removing the filler using the mask up to below the upper side of the insulating collar exposing the dielectric in a connecting region (KS), removing the exposed connecting region and the mask, and filling the trench with a further electrically conducting filler (20') to form a trenched contact.
机译:沟槽电容器的生产包括使用具有相应掩模开口的硬掩模(2、3)在基板(1)中提供沟槽(5),在沟槽中提供电容器电介质(30)和在沟槽中提供绝缘套环(10)。沟槽,在沟槽中提供导电填料(20),以插头的形式凸出到硬掩模的上侧,各向同性地将凸出在硬掩模的上侧的填料部分蚀刻到预定的厚度,在填充物的突出部分上形成掩模,使用该掩模去除填充物,直到绝缘套环的上侧下方,将电介质暴露在连接区域(KS)中,去除暴露的连接区域和掩模,并用另外的导电填充物(20')填充沟槽以形成沟槽接触。

著录项

  • 公开/公告号DE10334841A1

    专利类型

  • 公开/公告日2005-02-24

    原文格式PDF

  • 申请/专利权人 INFINEON TECHNOLOGIES AG;

    申请/专利号DE2003134841

  • 发明设计人 GOLDBACH MATTHIAS;KUDELKA STEPHAN;

    申请日2003-07-30

  • 分类号H01L21/8242;H01L21/311;

  • 国家 DE

  • 入库时间 2022-08-21 22:01:20

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