首页> 外国专利> Semiconductor device, e.g. dynamic random access memory, includes semiconductor substrate, and storage node having bottom portion and sidewall with recessed portion

Semiconductor device, e.g. dynamic random access memory, includes semiconductor substrate, and storage node having bottom portion and sidewall with recessed portion

机译:半导体器件动态随机存取存储器,包括半导体衬底以及具有底部和具有凹入部分的侧壁的存储节点

摘要

A semiconductor device comprises: a semiconductor substrate; and a storage node (482) formed over the substrate, and having a bottom portion and a sidewall (SW) extending upward from a rim of the bottom portion. A portion of the sidewall is recessed. An independent claim is also included for a method of fabricating a semiconductor device comprising: (A) forming a molding layer over a semiconductor substrate; (B) forming a storage contact hole penetrating the molding layer; (C) forming a storage node and a sacrificial layer pattern sequentially stacked in the storage contact hole, the top surface of the storage node being exposed between the molding layer and the sacrificial layer pattern; (D) forming a photoresist layer on the semiconductor substrate having the sacrificial layer pattern and the molding layer, the photoresist layer having a storage opening; and (E) performing an etch process on the storage node to partially remove the storage node through the storage opening, using the photoresist layer as an etch mask, the storage opening exposing the top surface of the storage node.
机译:一种半导体器件,包括:半导体衬底;以及存储节点(482)形成在基板上,并且具有底部和从底部的边缘向上延伸的侧壁(SW)。侧壁的一部分凹陷。还包括用于制造半导体器件的方法的独立权利要求,该方法包括:(A)在半导体衬底上形成模制层;以及(B)形成穿透成型层的存储接触孔; (C)形成依次层叠在存储接触孔中的存储节点和牺牲层图案,使存储节点的上表面露出在成型层和牺牲层图案之间。 (D)在具有牺牲层图案和成型层的半导体衬底上形成光刻胶层,该光刻胶层具有存储开口; (E)使用光致抗蚀剂层作为蚀刻掩模,在存储节点上执行蚀刻工艺以通过存储开口部分地去除存储节点,该存储开口暴露出存储节点的顶表面。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号