首页> 外国专利> Set programming method for phase change RAM, involves applying set current pulses such that magnitude of set current pulse is gradually decreased from stage to stage, for transitioning phase change cells to set resistance state

Set programming method for phase change RAM, involves applying set current pulses such that magnitude of set current pulse is gradually decreased from stage to stage, for transitioning phase change cells to set resistance state

机译:用于相变RAM的设置编程方法,包括施加设置电流脉冲,以便逐步改变设置电流脉冲的幅度,以便将相变单元转换为设置电阻状态

摘要

The phase change cells (PCELLS) are transitioned to the set resistance state by applying a set current pulse (ISET) to the phase change cells. The magnitude of the set current pulse is gradually decreased from stage to stage. Independent claims are also included for the following: (1) write drive circuit of phase change memory array; and (2) current controller in write driver circuit.
机译:通过将设置电流脉冲(ISET)施加到相变单元,相变单元(PCELLS)转变为设定电阻状态。设置电流脉冲的幅度逐级减小。还包括以下方面的独立权利要求:(1)相变存储阵列的写驱动电路; (2)写驱动器电路中的电流控制器。

著录项

  • 公开/公告号DE102004063767A1

    专利类型

  • 公开/公告日2005-08-04

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号DE20041063767

  • 发明设计人 AHN SU-JIN;

    申请日2004-12-29

  • 分类号G11C11/4193;G11C11/4197;

  • 国家 DE

  • 入库时间 2022-08-21 22:00:40

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