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INSTRUCTIONS AND PROCEDURES FOR THE ANALYSIS OF ATOMARS AND/OR MOLECULAR ELEMENTS, ROUTE SPECTROMETRIC INSTRUMENTS
INSTRUCTIONS AND PROCEDURES FOR THE ANALYSIS OF ATOMARS AND/OR MOLECULAR ELEMENTS, ROUTE SPECTROMETRIC INSTRUMENTS
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机译:用于分析原子和/或分子元素,路线分光仪器的指令和程序
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摘要
In a device and a method for the analysis of atomic and molecular elements by way of wavelength dispersive x-ray spectrometric structures including at least one mirror or focussing device having a multi-layer structure onto which fluorescent radiation generated by primary x-ray or electrons beams from a sample to be examined is directed and the reflected fluorescence radiation is supplied to a measuring device for determining the nature of impurities contained in the sample, the multi-layer structure consists of at least a lanthanum layer and a boron carbide layer.
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