首页> 外国专利> METHOD OF ACQUIRING CALIBRATION STRAIGHT LINE FOR FINDING SPECIFIC HEAT AT DESIRED TEMPERATURE, AND SPECIFIC HEAT MEASURING INSTRUMENT

METHOD OF ACQUIRING CALIBRATION STRAIGHT LINE FOR FINDING SPECIFIC HEAT AT DESIRED TEMPERATURE, AND SPECIFIC HEAT MEASURING INSTRUMENT

机译:确定特定温度下的热量的校准直线的获取方法以及特定的热量测量仪器

摘要

PROBLEM TO BE SOLVED: To provide a method of acquiring a calibration straight line and a specific heat measuring instrument in the specific heat measurement, which reduce the number of reference samples required when measuring specific heat, and find the accurate specific heat in an optional temperature.;SOLUTION: This method/instrument finds a thermal time constant and density of the first sample of which the specific heat at the first temperature is known, and a thermal time constant and density of the second sample of which the specific heat at the first temperature is known. The first calibration straight line L1 indicating a relation between density×specific heat at the first temperature and the thermal time constant, from values thereof is found, and the first intercept value indicating a value of density×specific heat when the heated time constant is set to zero, is computed in the first calibration straight line L1. Then, the calibration straight line L2 at the desired temperature is found on the basis of density and a heated time constant of the third sample of which the specific heat at the desired temperature is known, and of the first intercept value. The calibration straight line L2 at the desired temperature may be found using a correction value executed with prescribed temperature compensation, instead of the first intercept value, as needed.;COPYRIGHT: (C)2006,JPO&NCIPI
机译:要解决的问题:提供一种在比热测量中获取校准直线和比热测量仪器的方法,减少测量比热时所需的参考样品数量,并在可选温度下找到准确的比热解决方案:该方法/仪器找到已知第一温度下比热的第一样品的热时间常数和密度,以及发现第一温度下比热的第二样品的热时间常数和密度。温度是已知的。从第一校准直线L 1 的值中找出指示第一时间的密度和时间之间的关系的第一校准直线L 1 ,并从第一截取值指示密度和时间的比值在第一校准直线L 1 中计算加热时间常数设置为零时的热量。然后,根据第三样品的密度和加热时间常数,在已知温度下的校准直线L 2 的密度和加热时间常数被确定,第三样品的期望温度下的比热已知。第一个截距值。所需温度下的校准直线L 2 可以使用通过规定的温度补偿执行的校正值代替所需的第一截距值来找到。;版权:(C)2006,JPO&NCIPI

著录项

  • 公开/公告号JP2006118894A

    专利类型

  • 公开/公告日2006-05-11

    原文格式PDF

  • 申请/专利权人 KYOTO ELECTRON MFG CO LTD;

    申请/专利号JP20040304874

  • 发明设计人 KURAUCHI NAMI;KAWAGUCHI KENJI;

    申请日2004-10-19

  • 分类号G01N25/18;G01N9/00;

  • 国家 JP

  • 入库时间 2022-08-21 21:56:35

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