首页> 外国专利> SIMPLIFIED EVALUATION METHOD AND DEVICE FOR FREEZING AND LOW-TEMPERATURE STRESS RESISTANT LEVELS OF PLANT

SIMPLIFIED EVALUATION METHOD AND DEVICE FOR FREEZING AND LOW-TEMPERATURE STRESS RESISTANT LEVELS OF PLANT

机译:植物冻结和低温抗逆性的简化评估方法和装置

摘要

PROBLEM TO BE SOLVED: To provide a method for evaluating easily freezing and low-temperature stress resistant levels of a plant in a short time, without killing the plant.;SOLUTION: One part of a tissue of an individual grown under a cultivation condition suitable for a plant species from seeding up to an imago plant, for example, a leaf (using one sheet of leaf in the case of a small leaf and having a large number of leaves, one cut part of a leaf in the case having a large leaf), is cut out in the evaluated plant body, to be frozen in water, followed to be returned thereafter to an ambient temperature, an amino acid eluted from the leaf is brought into reaction with ninhydrin, an absorbance in 570 nm is measured by a spectrometer to measure a content thereof.;COPYRIGHT: (C)2006,JPO&NCIPI
机译:解决的问题:提供一种在短时间内容易评估植物的抗冰冻和抗低温胁迫能力而又不杀死植物的方法;解决方案:在合适的栽培条件下生长的个体组织的一部分用于从种子播种到凤梨科植物的植物物种,例如,叶子(小叶的情况下,用一片叶子,叶子很多,叶大的情况下,切掉一部分)在被评估的植物体内切下叶片,将其冷冻在水中,然后使其恢复到室温,使从叶片中洗脱的氨基酸与茚三酮反应,通过在570 nm处测定吸光度分光光度计测量其含量。;版权所有:(C)2006,日本特许厅和日本特许厅

著录项

  • 公开/公告号JP2006010476A

    专利类型

  • 公开/公告日2006-01-12

    原文格式PDF

  • 申请/专利权人 HITACHI LTD;

    申请/专利号JP20040187528

  • 发明设计人 YOSHIBA HIROCHIKA;SHIOZAKI NORIKO;

    申请日2004-06-25

  • 分类号G01N33/48;G01N21/78;G01N33/68;

  • 国家 JP

  • 入库时间 2022-08-21 21:56:22

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