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DEFECT CORRECTION DEVICE FOR PATTERN SUBSTRATE, DEFECT CORRECTION METHOD THEREFOR, AND METHOD OF MANUFACTURING PATTERN SUBSTRATE

机译:图案基质的缺陷校正装置,其缺陷修正方法以及制造图案基质的方法

摘要

PROBLEM TO BE SOLVED: To provide a defect correction method for pattern substrate and a defect correction device therefor for improving the productivity, and to provide a method of manufacturing the pattern substrate using the defect correction method for the pattern substrate.;SOLUTION: The defect correction device is provided with: a mask film reel 8 on which a mask film 5 to be arranged opposite to a substrate 6 is wound; transfer film loaders 21 which supply a piece of transfer film; and a repair head 35 movably disposed. Therein, a film holder 42 which holds the piece of the transfer film 18 and a laser beam source 1 which emits laser beam for forming an opening on the mask film 5 are disposed on the repair head 35, the repair head 35 is moved so that the film holder 42 is located at a position corresponding to the opening, the piece of the transfer film 18 is arranged above the opening disposed on the mask film 5 and the transfer layer of the transfer film 18 is transferred to the substrate via the opening of the mask film 5.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:提供用于图案基板的缺陷校正方法及其缺陷校正装置,以提高生产率,并提供一种使用用于图案基板的缺陷校正方法制造图案基板的方法。校正装置具有:掩模膜卷轴8,在其上卷绕有与基板6相对配置的掩模膜5。提供一张转印膜的转印膜装载器21;可移动地设置有修理头35。其中,在修复头35上设置有膜片保持器42,该膜片保持器42保持转印膜18的片和发射用于在掩模膜5上形成开口的激光束的激光源1,修复头35被移动,使得膜保持器42位于与开口相对应的位置处,一块转印膜18被布置在设置在掩模膜5上的开口上方,并且转印膜18的转印层通过开口被转印到基板上。口罩膜5 .;版权所有(C)2007,JPO&INPIT

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