首页> 外国专利> DEVICE FOR MEASURING DEFECT EXISTING IN LIGHT TRANSMITTING SINGLE LAYER BODY OR LAMINATE

DEVICE FOR MEASURING DEFECT EXISTING IN LIGHT TRANSMITTING SINGLE LAYER BODY OR LAMINATE

机译:用于测量光透射单层主体或叠层中存在的缺陷的设备

摘要

PROBLEM TO BE SOLVED: To provide a device for measuring a defect of an object in conformity with an optical property of the object.;SOLUTION: This device for measuring a defect existing in a light transmitting single layer body or a laminate is equipped with a light source for irradiating light from the back of the light transmitting single layer body or the laminate, one or two or more light quantity adjusting plates for adjusting the quantity of light irradiated from the light source, one or two or more slit plates positioned between the light quantity adjusting plates and the light transmitting single layer body or the laminate, and one or two or more detectors for recognizing the defect existing in the light transmitting single layer body or the laminate from the surface of the light transmitting single layer body or the laminate by the light irradiated from the back of the light transmitting single layer body or the laminate.;COPYRIGHT: (C)2006,JPO&NCIPI
机译:解决的问题:提供一种根据物体的光学特性来测量物体的缺陷的装置。解决方案:该用于测量存在于透光单层体或层压体中的缺陷的装置配备有用于从透光单层体或层压体的背面照射光的光源,用于调节从光源发出的光量的一个或两个或多个光量调节板,位于两个或多个之间的一个或两个或多个缝隙板。光量调节板和透光单层体或层压体,以及一个或两个或多个检测器,用于从透光单层体或层压体的表面识别透光单层体或层压体中存在的缺陷。由透光单层体或层压板的背面照射的光。;版权所有:(C)2006,JPO&NCIPI

著录项

  • 公开/公告号JP2006098122A

    专利类型

  • 公开/公告日2006-04-13

    原文格式PDF

  • 申请/专利权人 DAINIPPON PRINTING CO LTD;

    申请/专利号JP20040282172

  • 发明设计人 TAKAKU TORU;KODAMA TAKASHI;

    申请日2004-09-28

  • 分类号G01N21/958;

  • 国家 JP

  • 入库时间 2022-08-21 21:54:44

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