首页> 外国专利> METHOD OF FORMING RUTHENIUM FILM AND TUNNEL MAGNETORESISTANCE EFFECT MULTILAYER FILM

METHOD OF FORMING RUTHENIUM FILM AND TUNNEL MAGNETORESISTANCE EFFECT MULTILAYER FILM

机译:形成FI膜和隧道磁阻效应多层膜的方法

摘要

PROBLEM TO BE SOLVED: To provide a method of forming an Ru film which can perform precise film thickness control and a tunnel magnetoresistance effect multilayer film.;SOLUTION: The method of forming the Ru film includes a step of giving a predetermined bias potential to a substrate 20 when a non-magnetic Ru film interposed between a pair of ferromagnetic films is formed by a sputtering method, in the case that the tunnel magnetoresistance effect layer is formed on the substrate 20. In this case, in the case of sputtering, a predetermined high frequency power is applied to the substrate 20, and it can be controlled so that the potential of the substrate 20 is set to -20 to -100 V.;COPYRIGHT: (C)2006,JPO&NCIPI
机译:解决的问题:提供一种形成Ru膜的方法,该Ru膜可以执行精确的膜厚控制和隧道磁阻效应多层膜。解决方案:该Ru膜的形成方法包括以下步骤:将预定的偏置电势施加到衬底上。当在衬底20上形成隧道磁阻效应层的情况下,当通过溅射方法形成介于一对铁磁膜之间的非磁性Ru膜时,形成衬底20。预定的高频功率施加到基板20上,并且可以对其进行控制,以使基板20的电势设置为-20至-100V。版权所有:(C)2006,JPO&NCIPI

著录项

  • 公开/公告号JP2006134913A

    专利类型

  • 公开/公告日2006-05-25

    原文格式PDF

  • 申请/专利权人 ULVAC JAPAN LTD;

    申请/专利号JP20040318914

  • 发明设计人 MORITA TADASHI;

    申请日2004-11-02

  • 分类号H01L43/08;G11B5/39;H01F10/32;H01F41/18;H01L27/105;H01L21/8246;

  • 国家 JP

  • 入库时间 2022-08-21 21:54:19

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号