首页> 外国专利> METHOD OF MANUFACUTURING SUBSTRATE WITH Ge FINE CRYSTAL NUCLEI AND SUBSTRATE WITH Ge FINE CRYSTAL NUCLEI

METHOD OF MANUFACUTURING SUBSTRATE WITH Ge FINE CRYSTAL NUCLEI AND SUBSTRATE WITH Ge FINE CRYSTAL NUCLEI

机译:用锗微晶核制备基质的方法和利用锗微晶核制备基质的方法

摘要

PROBLEM TO BE SOLVED: To provide a manufacturing method of a substrate with Ge fine crystalline nuclei and the substrate with Ge fine crystalline nuclei which manufactures fine crystals serving as nuclei for the growth on a substrate, and controls the grain size and density thereof to manufacture a large grain size polycrystalline Si thin film.;SOLUTION: The method forms island-like independent Ge fine crystals by the solid phase growth method on a glass substrate for electronic industries, quartz glass substrate, thermo-oxidated Si wafer or substrate with SiO2 film, controls the grain size and density of the Ge fine crystal by oxygen etching at an etching temperature in a range of 300 to 600°C and an etching time, and dispersively disposes the Ge fine crystals having grain sizes of 1-40 nm on the substrate so that the density is 1×105-1×107/cm2.;COPYRIGHT: (C)2006,JPO&NCIPI
机译:解决的问题:提供一种具有Ge细晶核的衬底的制造方法,以及一种具有Ge细晶核的衬底的制造方法,该衬底制造出用作在衬底上生长的核的微晶,并控制其晶粒尺寸和密度以进行制造。解决方案:该方法通过固相生长法在电子工业玻璃基板,石英玻璃基板,热氧化硅晶片或SiO < Sub> 2 膜,通过在300至600℃的蚀刻温度和蚀刻时间下通过氧蚀刻来控制Ge细晶的晶粒尺寸和密度,并且分散地布置具有晶粒的Ge细晶。基板上1-40 nm的尺寸,因此密度为1×10 5 -1×10 7 / cm 2 .. COPYRIGHT :(C)2006,日本特许厅

著录项

  • 公开/公告号JP2006135149A

    专利类型

  • 公开/公告日2006-05-25

    原文格式PDF

  • 申请/专利权人 MORI YUZO;

    申请/专利号JP20040323511

  • 发明设计人 MORI YUZO;

    申请日2004-11-08

  • 分类号H01L21/20;C23C14/06;C23C14/58;H01L21/203;H01L21/3065;H01L29/786;H01L21/336;

  • 国家 JP

  • 入库时间 2022-08-21 21:54:12

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