首页> 外国专利> GAS JET MECHANISM FOR TEST PROBE BUILT IN SUBSTRATE INSPECTION DEVICE

GAS JET MECHANISM FOR TEST PROBE BUILT IN SUBSTRATE INSPECTION DEVICE

机译:基质检测装置中测试探针的气体喷射机理

摘要

PROBLEM TO BE SOLVED: To provide a gas jet mechanism for test probe built in a substrate inspection device capable of disturbing the mixture of lubricant oil into the supply air and controlling flow path by eliminating an electromagnetic valve.;SOLUTION: At least a first flow path control valve 34 mechanically switching the flow path of air supplied from an air supply source, a second flow control valve 52 operated by receiving pressure of air supplied from the first intake path ensured by the first flow path control valve 34, and a nozzle 18 provided with a gas jet piece discharging gas directly sent from the gas supply source via a second intake path ensured by the second flow path control valve 52 to a specific direction are provided. The nozzle 18 is arranged by making free, the jet to a contact pin of a test probe 101 provided with a substrate test device.;COPYRIGHT: (C)2006,JPO&NCIPI
机译:要解决的问题:提供一种用于在衬底检查装置中内置的测试探针的气体喷射装置,该装置能够干扰润滑油混入供气并通过消除电磁阀来控制流路。路径控制阀34机械地切换从空气供应源供应的空气的流路,通过接收由第一流路控制阀34确保的从第一进气路径供应的空气的压力而操作的第二流控制阀52和喷嘴18设有气体喷射片,该气体喷射片将从气体供给源经由第二流路控制阀52确保的第二进气路径直接从气体供给源送出到特定方向。通过自由地将喷嘴喷射到设置有基板测试装置的测试探针101的接触销上来布置喷嘴18。版权所有:(C)2006,JPO&NCIPI

著录项

  • 公开/公告号JP2006029908A

    专利类型

  • 公开/公告日2006-02-02

    原文格式PDF

  • 申请/专利权人 HIOKI EE CORP;

    申请/专利号JP20040207163

  • 发明设计人 WADA TSUKASA;

    申请日2004-07-14

  • 分类号G01R1/06;G01R31/28;

  • 国家 JP

  • 入库时间 2022-08-21 21:53:16

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