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Polycrystalline germanium-based waveguide detector integrated on thin-film silicon-on-insulator (SOI) platform

机译:集成在绝缘体薄膜硅(SOI)平台上的多晶锗基波导探测器

摘要

A photodetector for use with relatively thin (i.e., sub-micron) silicon optical waveguides formed in a silicon-on-insulator (SOI) structure comprises a layer of poly-germanium disposed to couple at least a portion of the optical signal propagating along the silicon optical waveguide. Tight confinement of the optical signal within the waveguide structure allows for efficient evanescent coupling into the poly-germanium detector. The silicon optical waveguide may comprise any desired geometry, with the poly-germanium detector formed to either cover a portion of the waveguide, or be butt-coupled to an end portion of the waveguide. When covering a portion of the waveguide, poly-germanium detector may comprise a "wrap-around" geometry to cover the side and top surfaces of the optical waveguide, with electrical contacts formed at opposing ends of the detector.
机译:与在绝缘体上硅(SOI)结构中形成的相对较薄(即亚微米)的硅光波导一起使用的光电探测器,包括一层多晶硅层,该多层锗被布置为耦合沿光子传输的至少一部分光信号。硅光波导。将光信号严格限制在波导结构内,可以有效地将e逝波耦合到多晶硅锗探测器中。硅光学波导可以包括任何期望的几何形状,其中多晶硅锗检测器形成为覆盖波导的一部分,或者对接耦合到波导的端部。当覆盖波导的一部分时,多晶硅锗探测器可包括“环绕”几何形状以覆盖光波导的侧表面和顶表面,并且在探测器的相对端形成电接触。

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