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EDDY CURRENT PROBE AND EDDY CURRENT ARRAY PROBE

机译:涡流探头和涡流阵列探头

摘要

PROBLEM TO BE SOLVED: To provide an eddy current array probe that has improved and more uniform sensitivity to a crack in a radial, axial, or circumferential surface and reduces the variation between channels crossing an array.;SOLUTION: The eddy current array probes (ECAPs) have a reinforced drive coil configuration. In one array, the ECAPs 10 have a plurality of EC channels 12 and drive coils 14. Each drive coil is disposed in each EC channel. The drive coil has different polarization from an adjacent drive coil. One example, for detecting a flaw with a plurality of scans and in an array configuration, comprises at least one substrate 32, some sensing coils 16 and 18 arranged on the substrate, and the drive coil 14 for surrounding all the sensing coils.;COPYRIGHT: (C)2006,JPO&NCIPI
机译:要解决的问题:提供一种涡流阵列探头,该探头对径向,轴向或圆周表面的裂缝具有改善的灵敏度和更均匀的灵敏度,并减少穿过阵列的通道之间的变化。;解决方案:涡流阵列探头( ECAP)具有增强的驱动线圈配置。在一个阵列中,ECAP 10具有多个EC通道12和驱动线圈14。每个驱动线圈设置在每个EC通道中。驱动线圈具有与相邻驱动线圈不同的极化。一个示例,用于通过多次扫描并以阵列配置检测缺陷,包括至少一个基板32,布置在基板上的一些感应线圈16和18,以及用于包围所有感应线圈的驱动线圈14。 :(C)2006,日本特许厅

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