首页> 外国专利> HOLE-PITCH MEASURING METHOD AND HOLE-PITCH MEASURING INSTRUMENT

HOLE-PITCH MEASURING METHOD AND HOLE-PITCH MEASURING INSTRUMENT

机译:孔距测量方法和孔距测量仪器

摘要

PROBLEM TO BE SOLVED: To provide a hole-pitch measuring method that can simply measure, in a short time whether a pitch between pitches of a first hole and a second hole provided in a workpiece is held in a regulated range.;SOLUTION: Two pins 5 and 5 arranged in parallel to two vertexes of a triangle are provided, and further, a hole pitch measuring instrument 1 for providing a probe 7a of a dial gauge 7 performing zero adjustment is used by using a master gauge on the other vertex of the triangle. The hole pitch measuring method comprises bringing the two pins 5 and 5 of the hole pitch measuring instrument 1 into contact with the inside diameter face of the first hole H1 of the workpiece W, bringing the probe 7a into contact with the inside diameter face of the second hole H2, measuring the inner face position (size b) of the second hole H2 and regarding the pins 5 and 5 as a reference, and comparing the quality determination of the pitch a between the centers of the first hole H1 and the second hole H2 with the master gauge.;COPYRIGHT: (C)2006,JPO&NCIPI
机译:解决的问题:提供一种孔距测量方法,该方法可以在短时间内简单地测量工件中设置的第一孔和第二孔的螺距之间的螺距是否保持在规定的范围内。提供平行于三角形的两个顶点布置的销5和5,此外,通过使用主规在另一个顶点上使用孔距测量仪器1,该孔距测量仪器1用于提供执行零位调节的百分表7的探针7a。三角形。孔距测量方法包括使孔距测量仪器1的两个销5和5与工件W的第一孔H1的内径面接触,使探头7a与工件W的第一孔H1的内径面接触。在第二孔H2中,测量第二孔H2的内表面位置(尺寸b),并以销5和5为基准,比较第一孔H1和第二孔的中心之间的节距a的质量确定。 H2,带主压力表。;版权所有:(C)2006,JPO&NCIPI

著录项

  • 公开/公告号JP2005338001A

    专利类型

  • 公开/公告日2005-12-08

    原文格式PDF

  • 申请/专利权人 SUMITOMO DENKO SHOKETSU GOKIN KK;

    申请/专利号JP20040159956

  • 发明设计人 ISHIBASHI YASUTAKA;

    申请日2004-05-28

  • 分类号G01B5/14;

  • 国家 JP

  • 入库时间 2022-08-21 21:50:41

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号