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In the cell thick measuring method which measures the cell thickness cell thick measuring method, making use

机译:在测量细胞厚度的细胞厚度测量方法中,利用

摘要

PROBLEM TO BE SOLVED: To highly accurately measure a cell thickness of a liquid crystal cell including a twisted orientation liquid crystal by making it possible to apply the Senarmont principle to the measurement. ;SOLUTION: A light projected from a laser oscillator 11 is taken out as a linearly polarized light L0 with the use of a polarizing plate 4. The linearly polarized light is shed onto a liquid crystal cell 3 to be measured which includes a TN(twisted nematic) liquid crystal of a twist angle of 90°. The light projected from the liquid crystal cell is input to a 1/4 wave length plate 6, and an azimuth angle θ of a polarization axis L1 of the light out of the 1/4 wave length plate is detected. An apparent retardation R' is calculated from the azimuth angle θ. A true retardation R is converted from the apparent retardation R'. A thickness (d) of the cell is calculated from the true retardation (R=Δn.d: Δn is a difference of indices of refraction in a horizontal direction and a vertical direction of the liquid crystal).;COPYRIGHT: (C)1998,JPO
机译:解决的问题:通过将Senarmont原理应用于测量,可以高度准确地测量包括扭曲取向液晶的液晶盒的盒厚度。 ;解决方案:使用偏振片4将激光振荡器11投射的光作为线性偏振光L 0 取出。线性偏振光被投射到液晶单元3上,从而被测物包括扭曲角为90°的TN(扭曲向列)液晶。从液晶单元投射的光被输入到1/4波长板6,并且方位角θ为0°。检测出从1/4波长板射出的光的偏振轴L 1 的角度。根据方位角θ计算视在延迟R'。从表观延迟R'转换真正的延迟R。根据真实延迟(R =Δnd:Δn是液晶的水平方向和垂直方向上的折射率之差)计算单元的厚度(d)。COPYRIGHT:(C 1998年,日本特许厅

著录项

  • 公开/公告号JP3792315B2

    专利类型

  • 公开/公告日2006-07-05

    原文格式PDF

  • 申请/专利权人 セイコーエプソン株式会社;

    申请/专利号JP19960270908

  • 发明设计人 平田 祥朋;百瀬 洋一;

    申请日1996-10-14

  • 分类号G01B11/06;G01M11/00;

  • 国家 JP

  • 入库时间 2022-08-21 21:49:41

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