SEU-tolerant QDI circuits

摘要

The invention provides circuits that are tolerant to soft errors, such as a single event upset (SEU). The circuits may have a chain of permitted state changes. Redundant elements, including redundant literals and assignments, are designed and implemented in the circuit. The design is such that a disruption or change of state on a single element by and SEU will not change the state flow of a circuit or lead to impermissible state changes. In one embodiment, the invention is implemented in quasi-delay-insensitive (QDI) asynchronous circuits.