首页> 外国专利> Inspection apparatus, aid device for creating judgement model therefor, abnormality detection device for endurance test apparatus and endurance test method

Inspection apparatus, aid device for creating judgement model therefor, abnormality detection device for endurance test apparatus and endurance test method

机译:检查设备,用于为其创建判断模型的辅助设备,用于耐久测试设备的异常检测设备以及耐久测试方法

摘要

An endurance test is carried out after judgment models are created from normal data obtained from test apparatus while operating stably and presence and absence of abnormality in a target object is judged from waveform data obtained during the test and by using the created judgment models. An aid device creates such judgment models automatically by creating divided waveform data by dividing obtained waveform data into portions of unit time, obtaining characteristic quantities in units of the divided waveform data based on a plurality of the divided waveform data for the unit time. The judgment models are created for the unit time based on the obtained characteristic quantities.
机译:在稳定运行的情况下,根据从测试设备获得的正常数据创建判断模型,然后根据测试过程中获得的波形数据判断目标对象是否存在异常,从而进行耐久测试。辅助装置通过将获得的波形数据划分为单位时间的部分来创建划分波形数据,并基于单位时间的多个划分波形数据,以划分波形数据为单位获得特征量,从而自动创建这样的判断模型。基于获得的特征量,为单位时间创建判断模型。

著录项

  • 公开/公告号US2006224367A1

    专利类型

  • 公开/公告日2006-10-05

    原文格式PDF

  • 申请/专利权人 IKUMA FUKUI;

    申请/专利号US20060372963

  • 发明设计人 IKUMA FUKUI;

    申请日2006-03-09

  • 分类号G06F17/10;

  • 国家 US

  • 入库时间 2022-08-21 21:45:02

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