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Scan capable dual edge-triggered state element for application of combinational and sequential scan test patterns
Scan capable dual edge-triggered state element for application of combinational and sequential scan test patterns
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机译:具有扫描功能的双边沿触发状态元素,适用于组合和顺序扫描测试图案
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摘要
An apparatus and method of scanning a dual edge-triggered flip-flop with scan capability includes a first scan slave element capable of capturing data on a positive edge of a clock signal; and a second scan slave element capable of capturing data on a negative edge of the clock signal. An apparatus and method of scanning a dual edge-triggered flip-flop with scan capability includes a scan slave element capable of capturing data on either a positive edge or a negative edge of a clock signal; wherein a control signal determines whether the scan slave element captures data on the positive edge or negative edge of the clock signal.
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