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At-speed on-chip short clock cycle monitoring system and method

机译:全速片上短时钟周期监视系统和方法

摘要

The present invention provides a system and method for monitoring a short clock cycle on a semiconductor chip. The system includes a phase-locked loop (PLL) for receiving a reference clock as input and for outputting a PLL clock out. The system includes a delay-locked loop (DLL) for receiving the PLL clock out as input and for outputting a DLL phase offset clock. The DLL is locked to a frequency of the PLL clock out. The system may include an edge comparator for receiving the PLL clock out and the DLL phase offset clock as input. The edge comparator is suitable for monitoring each edge of the PLL clock out and each edge of the DLL phase offset clock, and for reporting a short clock cycle when an edge of the PLL clock out comes before an edge of the DLL phase offset clock.
机译:本发明提供了一种用于监视半导体芯片上的短时钟周期的系统和方法。该系统包括锁相环(PLL),用于接收参考时钟作为输入并输出PLL时钟输出。该系统包括一个延迟锁定环路(DLL),用于接收PLL时钟输出作为输入并输出DLL相位偏移时钟。 DLL被锁定为PLL时钟输出的频率。该系统可以包括边缘比较器,用于接收PLL时钟输出和DLL相位偏移时钟作为输入。边沿比较器适用于监视PLL时钟输出的每个边沿和DLL相位偏移时钟的每个边沿,并且当PLL时钟输出的边沿在DLL相位偏移时钟的边沿之前时,适用于报告较短的时钟周期。

著录项

  • 公开/公告号US7129690B1

    专利类型

  • 公开/公告日2006-10-31

    原文格式PDF

  • 申请/专利权人 JONATHAN SCHMITT;STEVE WURZER;

    申请/专利号US20050321747

  • 发明设计人 JONATHAN SCHMITT;STEVE WURZER;

    申请日2005-12-29

  • 分类号G01R23/12;G01R23/175;G06F1/04;

  • 国家 US

  • 入库时间 2022-08-21 21:42:32

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