首页> 外国专利> Method to prevent metal oxide formation during polycide reoxidation

Method to prevent metal oxide formation during polycide reoxidation

机译:防止多晶硅化物再氧化过程中形成金属氧化物的方法

摘要

A selective spacer to prevent metal oxide formation during polycide reoxidation of a feature such as an electrode and a method for forming the selective spacer are disclosed. A material such as a thin silicon nitride or an amorphous silicon film is selectively deposited on the electrode by limiting deposition time to a period less than an incubation time for the material on silicon dioxide near the electrode. The spacer is deposited only on the electrode and not on surrounding silicon dioxide. The spacer serves as a barrier for the electrode during subsequent oxidation to prevent metal oxide formation while allowing oxidation to take place over the silicon dioxide.
机译:公开了一种用于防止在诸如电极的特征的多硅化物再氧化期间形成金属氧化物的选择性隔离物及其形成方法。通过将沉积时间限制为小于电极附近二氧化硅上的材料的孵育时间的时间段,可以在电极上选择性地沉积诸如薄氮化硅或非晶硅膜之类的材料。隔离物仅沉积在电极上,而不沉积在周围的二氧化硅上。间隔物在随后的氧化期间用作电极的阻挡层,以防止形成金属氧化物,同时允许在二氧化硅上发生氧化。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号