ZIF connector and semiconductor-testing apparatus using the same

摘要

There is provided a ZIF connector which can be connected with a connecting part readily, correctly and reliably and a semiconductor-testing apparatus with the ZIF connector. The connector (2) comprises: an opening (22) through which a plug (1) is inserted; and a plurality of opposing contacts (21A), (21B) inside the opening (22). The contacts (21A), (21B) are opened and closed by a contact open-and-close mechanism. A moving block (23) holding the contacts in a cantilever manner so that one end side of the contacts (21A), (21B) is open in a form of the character ‘V’. A shell (24) for slidably housing the moving block with the contacts (21A), (21B). When the contact open-and-close mechanism moves the moving block (23) toward the opening (22), the one end side of the contacts is characterized in the ‘V’ shape, which slides on the paired inclined faces (25A), (25B) of a first guide block (25) so as to widen the distance between the contacts (21A), (21B).