首页>
外国专利>
System and method for decreasing ESD damage during component level long term testing
System and method for decreasing ESD damage during component level long term testing
展开▼
机译:在组件级长期测试过程中减少ESD损坏的系统和方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
A method is disclosed for minimizing damage from electrostatic discharge (ESD) during long-term testing of electronic components and assemblies. The method includes conducting a stress-test, during which a protection circuit is engaged, which shields components and assemblies from ESD. Then at least one functional test is conducted, at which time, the protection circuit is disengaged.;Also disclosed is a system for conducting long-term testing of electronic components and assemblies while providing protection from ESD. The system includes a testing circuit for providing current to the components and assemblies during the long-term testing which includes at least one stress-testing phase and at least one functional testing phase. Also included is a protection circuit for protecting the components and assemblies during said stress-testing phase of said long-term testing. A switch is included for disengaging the protection circuit from the components and assemblies during said functional testing phase of said long-term testing.
展开▼