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METHOD AND APPARATUS FOR DEPOSITION REMOVAL AND RECYCLE CLEANING OF COPPER INTERCONNECT SEMICONDUCTOR PROCESS KITS.

机译:用于铜互连半导体工艺套件的沉积去除和循环清洁的方法和装置。

摘要

ABSTRACT OF THE INVENTIONTITLE OF THE INVENTION: Method and apparatus for deposition removal and recycle cleaning of copper interconnect semiconductor process kits.Semiconductor process kits are critical components within the semiconductor manufacturing equipment, and they require recycle cleaning for reuse so as to completely remove contamination particles to prevent inducing deposition defects and affects yield. Contamination within the process kits occurs because of the accumulation of deposited layers peel off due to repeated exposure to the deposition process. Therefore, there is a critical need to do deposition removal and recycle cleaning of the process kits for reuse. However, most semiconductor process kits are made from a combination of stainless steel or aluminum, and may contained copper, titanium, and quartz and ceramics materials. Therefore, each deposition removal and recycling precision cleaning process for different process kits must be custom-made for the specific process kits and component, exposed surfaces and nature of contamination as well as process compatibility. This invention provides a Best-Known-Method (BKM) and apparatus for deposition removal and recycle cleaning, such as chemical stripping, acid etching, mix-acid cleaning and rinsing, mechanical cleaning, thin-film thermal coatings and surface treatment, etc. The choice and optimization of these BKM are based on the knowledge of the substrate materials to be cleaned and of the type of deposited contaminants to be removed. This invention is effective in reducing the levels of surface contaminants, such as particles, ionic contaminants and some hydrocarbons that are introduced during the semiconductor production process, without corroding, damaging or altering the process kits material and surface morphology.FIGURE 1
机译:发明内容发明内容:用于沉积物去除和再循环的方法和设备清洗铜互连半导体工艺套件。半导体工艺套件是半导体制造中的关键组件设备,它们需要进行循环清洁以重复使用,以便完全去除污染颗粒,以防止引起沉积缺陷并影响产量。污染工艺套件之内发生的原因是由于沉积层的堆积而导致剥离重复暴露于沉积过程。因此,非常需要进行沉积移除并回收处理套件以进行重复使用。但是,大多数半导体处理套件由不锈钢或铝制成,可能包含铜,钛以及石英和陶瓷材料。因此,每次沉积去除和必须针对不同工艺套件定制回收精确清洁工艺特定的处理套件和组件,暴露的表面和污染物的性质以及流程兼容性。本发明提供了一种最佳已知方法(BKM)和用于沉积物去除和循环清洁,例如化学剥离,酸蚀,混合酸清洗和漂洗,机械清洗,薄膜热涂层和表面处理等。这些BKM的选择和优化基于对基材的了解要清洁的材料以及要清除的沉积污染物的类型。本发明有效降低表面污染物的水平,例如颗粒,离子污染物以及在半导体生产过程中引入的一些碳氢化合物,不会腐蚀,损坏或改变处理套件的材料和表面形态。图1

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