首页> 外国专利> Optimization of multi-source microwave furnace yield involves determining sample position with optimum heating efficiency with respect to reference, and using accessing system to expose sample to microwave radiation of sufficient power

Optimization of multi-source microwave furnace yield involves determining sample position with optimum heating efficiency with respect to reference, and using accessing system to expose sample to microwave radiation of sufficient power

机译:多源微波炉产量的优化包括确定样品相对于参考的最佳加热效率的位置,并使用检修系统将样品暴露于足够功率的微波辐射下

摘要

A sample is placed underneath or within a multi-source microwave furnace at a distance from magnetrons to heat the sample. The distance of the sample with respect to a reference magnetron is continuously varied until a point where maximum efficiency is measured. Once the optimum position is determined, an accessing system is placed in the optimum position point to put the sample under microwave radiations of sufficient power. Microwave sensors are used to measure the efficiency in heating the sample using low power radiation. The heating efficiency is estimated for each of the distances of the sample with respect to the reference magnetron. The accessing system may be manual or mechanical to put the sample under microwave conditions of sufficient power and for heating the sample using less energy consumption and in less possible time.
机译:将样品放置在多源微波炉的下方或内部,与磁控管保持一定距离,以加热样品。样品相对于参考磁控管的距离不断变化,直到测量到最大效率为止。确定最佳位置后,将进入系统放置在最佳位置,以将样品置于足够功率的微波辐射下。微波传感器用于测量使用低功率辐射加热样品的效率。对于样品相对于参考磁控管的每个距离,估计加热效率。进入系统可以是手动的或机械的,以将样品置于足够功率的微波条件下,并以较少的能量消耗和较少的时间加热样品。

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