首页> 外国专利> DEEP N WELLS IN TRIPLE WELL STRUCTURES AND METHOD FOR FABRICATING SAME

DEEP N WELLS IN TRIPLE WELL STRUCTURES AND METHOD FOR FABRICATING SAME

机译:三井结构中的深N井及其制造方法

摘要

A disclosed method for fabricating a structure in a semiconductor die comprises steps of implanting a deep N well (240) in a substrate, depositing an epitaxial layer over the substrate, and forming a P well (242) and a lateral isolation N well (246) over the deep N well, wherein the lateral isolation N well laterally surrounds the P well, and wherein the deep N well and the lateral isolation N well electrically isolate the P well. Implanting a deep N well can comprise steps of depositing a screen oxide layer over the substrate, forming a mask over the screen oxide layer, implanting the deep N well in the substrate, removing the mask, and removing the screen oxide layer. Depositing the epitaxial layer can comprise depositing a single crystal silicon over the substrate.
机译:用于在半导体管芯中制造结构的公开方法包括以下步骤:在衬底中注入深N阱(240),在衬底上沉积外延层,并形成P阱(242)和横向隔离N阱(246) )在深N阱上,其中横向隔离N阱在侧面围绕P阱,并且其中深N阱和横向隔离N阱将P阱电隔离。注入深N阱可以包括以下步骤:在衬底上方沉积丝网氧化物层;在丝网氧化物层上方形成掩模;在衬底中注入深N阱;去除掩模;以及去除丝网氧化物层。沉积外延层可以包括在衬底上方沉积单晶硅。

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