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CRYSTALLOGRAPHIC ALIGNMENT OF HIGH-DENSITY NANOWIRE ARRAYS

机译:高密度纳米阵列的晶体学校准

摘要

A method for controlling the crystallographic growth direction and geometric and physical characteristics of nanowires using a metal-organic chemical vapor deposition and substrate selection. As an illustration of the method, epitaxial growth of wurtzite gallium nitride on (100) y -LiAIOSUB2/SUB and (111) MgO single crystal substrates resulted in the selective growth of nanowires in the orthogonal [110] and [001] directions, respectively. Triangular and hexagonal cross sections were observed as a result of substrate-induced constraints of lattice parameter matching and symmetry registry. These nanowire arrays exhibit a systematic difference in their temperature­ dependent band-edge emission resulting from the different size, shape, and anisotropic polarity of the nanostructures. Scaling of the synthetic process is entirely compatible with existing GaN thin-film technology and should enable the realization of a new generation of GaN nanowire devices and systems.
机译:一种使用金属有机化学气相沉积和衬底选择来控制纳米线的晶体生长方向以及几何和物理特性的方法。作为该方法的说明,纤锌矿型氮化镓在(100)y -LiAIO 2 和(111)MgO单晶衬底上的外延生长导致纳米线在正交[110]和垂直方向上选择性生长。 [001]个方向。由于基底引起的晶格参数匹配和对称配准约束,观察到了三角形和六边形截面。由于纳米结构的尺寸,形状和各向异性极性不同,这些纳米线阵列在其随温度变化的能带边缘发射中表现出系统的差异。合成工艺的规模与现有的GaN薄膜技术完全兼容,并且应该能够实现新一代的GaN纳米线器件和系统。

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