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Method and apparatus of automatically selecting Bragg reflections and method and system of automatically determining crystallographic orientation
Method and apparatus of automatically selecting Bragg reflections and method and system of automatically determining crystallographic orientation
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机译:自动选择布拉格反射的方法和装置以及自动确定晶体取向的方法和系统
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摘要
A novel method and novel apparatus that are capable of selecting, with a computer, reference Bragg reflections pcl and pc2, which form a basis for determination of the crystallographic orientation of a crystal sample by the two-reflection method, automatically and easily and accurately, wherein; firstly, x-ray intensities and diffraction conditions of all Bragg reflections which are measurable are calculated using the crystallographic information, secondly, a weight-point according to both the x-ray intensity and the angle between the sample normal and the scattering vector is obtained for each of the Bragg reflections, thirdly, two Bragg reflections having the two largest weight-points are selected as the reference Bragg reflections pc1 and pc2, respectively.
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